Electrical characterization of defects introduced during electron beam deposition of W Schottky contacts on n-type 4H-SiC

Omotoso, E. / Meyer, W.E. / Coelho, S.M.M. et al. | British Library Online Contents | 2016

Electrical characterization of defects introduced during electron beam deposition of W Schottky contacts on n-type 4H-SiC

Omotoso, E. / Meyer, W.E. / Coelho, S.M.M. et al. | British Library Online Contents | 2016

Electronic properties of defects introduced in GaAs during sputter deposition of gold Schottky contacts

Auret, F. D. / Goodman, S. A. / Leclerc, Y. et al. | British Library Online Contents | 1997

Electronic properties and transformation kinetics of two prominent metastable defects introduced in GaAs during sputter deposition of Au Schottky contacts

Taghizadeh, F. / Janse van Rensburg, P.J. / Ostvar, K. et al. | British Library Online Contents | 2019

Electrical characterization of defects introduced during sputter deposition of tungsten on n type 4H-SiC

Tunhuma, Shandirai M. / Auret, F.D. / Legodi, M.J. et al. | British Library Online Contents | 2018