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Residual strain in Ge films grown by surfactant-mediated epitaxy on Si(111) and Si(001) substrates
Residual strain in Ge films grown by surfactant-mediated epitaxy on Si(111) and Si(001) substrates
Residual strain in Ge films grown by surfactant-mediated epitaxy on Si(111) and Si(001) substrates
Wietler, T. F. (author) / Bugiel, E. (author) / Hofmann, K. R. (author)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 9 ; 659-663
2006-01-01
5 pages
Article (Journal)
English
DDC:
621.38152
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