Transmission electron microscopy investigation of interfacial reactions between SrFeO~3 thin films and silicon substrates: Fid-Bau Portal

Transmission electron microscopy investigation of interfacial reactions between SrFeO~3 thin films and silicon substrates

Wang, D. / Tunney, J. J. / Du, X. / Post, M. L. / Gauvin, R.

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Transmission electron microscopy investigation of interfacial reactions between SrFeO~3 thin films and silicon substrates

Wang, D. / Tunney, J. J. / Du, X. / Post, M. L. / Gauvin, R.

Transmission electron microscopy investigation of interfacial reactions between SrFeO~3 thin films and silicon substrates

Wang, D. / Tunney, J. J. / Du, X. / Post, M. L. / Gauvin, R.

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Document information

Title:

Transmission electron microscopy investigation of interfacial reactions between SrFeO~3 thin films and silicon substrates

Contributors:

Wang, D. (author) / Tunney, J. J. (author) / Du, X. (author) / Post, M. L. (author) / Gauvin, R. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 22 ; 76-88

Publication date:

2007-01-01

Size:

13 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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