In-Situ Transmission Electron Microscopy Investigation of the Interfacial Reaction between Er and SiO~2 Films: Fid-Bau Portal

In-Situ Transmission Electron Microscopy Investigation of the Interfacial Reaction between Er and SiO~2 Films

Choi, C.-J. / Kang, S.-M. / Hong, H.-B. / Lee, S.-H. / Kim, J.-G. / Ahn, K.-S. / Yoon, J.-W.

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In-Situ Transmission Electron Microscopy Investigation of the Interfacial Reaction between Er and SiO~2 Films

Choi, C.-J. / Kang, S.-M. / Hong, H.-B. / Lee, S.-H. / Kim, J.-G. / Ahn, K.-S. / Yoon, J.-W.

In-Situ Transmission Electron Microscopy Investigation of the Interfacial Reaction between Er and SiO~2 Films

Choi, C.-J. / Kang, S.-M. / Hong, H.-B. / Lee, S.-H. / Kim, J.-G. / Ahn, K.-S. / Yoon, J.-W.

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Document information

Title:

In-Situ Transmission Electron Microscopy Investigation of the Interfacial Reaction between Er and SiO~2 Films

Contributors:

Choi, C.-J. (author) / Kang, S.-M. (author) / Hong, H.-B. (author) / Lee, S.-H. (author) / Kim, J.-G. (author) / Ahn, K.-S. (author) / Yoon, J.-W. (author)

Published in:

Crystallographic Orientation Distribution and Related Properties in Advanced Materials II ; 793-798

MATERIALS TRANSACTIONS ; 51

Publication date:

2010-01-01

Size:

6 pages

ISSN:

1345-9678

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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