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Characterization of rare earth oxides based MOSFET gate stacks prepared by metal-organic chemical vapour deposition
Characterization of rare earth oxides based MOSFET gate stacks prepared by metal-organic chemical vapour deposition
Characterization of rare earth oxides based MOSFET gate stacks prepared by metal-organic chemical vapour deposition
Frohlich, K. (author) / Luptak, R. (author) / Dobrocka, E. (author) / Husekova, K. (author) / Cico, K. (author) / Rosova, A. (author) / Lukosius, M. (author) / Abrutis, A. (author) / Pisecny, P. (author) / Espinos, J. P. (author)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 9 ; 1065-1072
2006-01-01
8 pages
Article (Journal)
English
DDC:
621.38152
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