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    Microstructure and electrical characterization based on AFM of very high-doped polysilicon grains

    New search for: Coq Germanicus, R.
    New search for: Picard, E.
    New search for: Domenges, B.
    New search for: Danilo, K.
    New search for: Rogel, R.

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    Microstructure and electrical characterization based on AFM of very high-doped polysilicon grains

    New search for: Coq Germanicus, R.
    New search for: Picard, E.
    New search for: Domenges, B.
    New search for: Danilo, K.
    New search for: Rogel, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Microstructure and electrical characterization based on AFM of very high-doped polysilicon grains

    New search for: Coq Germanicus, R.
    New search for: Picard, E.
    New search for: Domenges, B.
    New search for: Danilo, K.
    New search for: Rogel, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Microstructure and electrical characterization based on AFM of very high-doped polysilicon grains

    Contributors:

    Coq Germanicus, R. (author) / Picard, E. (author) / Domenges, B. (author) / Danilo, K. (author) / Rogel, R. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 253 ; 6006-6012

    Publication date:

    2007-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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