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Distinction of the Nuclei of Shockley Faults in 4H-SiC{0001} pin Diodes by Electroluminescence Imaging
Distinction of the Nuclei of Shockley Faults in 4H-SiC{0001} pin Diodes by Electroluminescence Imaging
Distinction of the Nuclei of Shockley Faults in 4H-SiC{0001} pin Diodes by Electroluminescence Imaging
Ishii, R. (author) / Miyanagi, T. (author) / Kamata, I. (author) / Tsuchida, H. (author) / Nakayama, K. (author) / Sugawara, Y. (author) / Wright, N. / Johnson, C. M. / Vassilevski, K. / Nikitina, I.
2007-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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