Overlapping Shockley/Frank Faults in 4H-SiC PiN Diodes: Fid-Bau Portal

Overlapping Shockley/Frank Faults in 4H-SiC PiN Diodes

Twigg, M. E. / Stahlbush, R. E. / Losee, P. A. / Li, C. H. / Bhat, I. B. / Chow, T. P.

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Overlapping Shockley/Frank Faults in 4H-SiC PiN Diodes

Twigg, M. E. / Stahlbush, R. E. / Losee, P. A. / Li, C. H. / Bhat, I. B. / Chow, T. P.

Overlapping Shockley/Frank Faults in 4H-SiC PiN Diodes

Twigg, M. E. / Stahlbush, R. E. / Losee, P. A. / Li, C. H. / Bhat, I. B. / Chow, T. P.

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Title:

Overlapping Shockley/Frank Faults in 4H-SiC PiN Diodes

Contributors:

Twigg, M. E. (author) / Stahlbush, R. E. (author) / Losee, P. A. (author) / Li, C. H. (author) / Bhat, I. B. (author) / Chow, T. P. (author) / Devaty, R. P. / Larkin, D. J. / Saddow, S. E.

Published in:

Silicon Carbide and Related Materials - 2005 ; 383-386

MATERIALS SCIENCE FORUM ; 527/529

Publication date:

2006-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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