A platform for research: civil engineering, architecture and urbanism
Reduction of the Surface Density of Single Shockley Faults by TCS Growth Process
Reduction of the Surface Density of Single Shockley Faults by TCS Growth Process
Reduction of the Surface Density of Single Shockley Faults by TCS Growth Process
Canino, A. (author) / Camarda, M. (author) / La Via, F. (author) / Monakhov, E.V. / Hornos, T. / Svensson, B.G.
2011-01-01
4 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Single Shockley Faults Enlargement during Micro-Photoluminescence Defects Mapping
British Library Online Contents | 2010
|Single Shockley Stacking Faults in As-Grown 4H-SiC Epilayers
British Library Online Contents | 2010
|Overlapping Shockley/Frank Faults in 4H-SiC PiN Diodes
British Library Online Contents | 2006
|Observation of Shrinking and Reformation of Shockley Stacking Faults by PL Mapping
British Library Online Contents | 2006
|British Library Online Contents | 2010
|