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Excess Carrier Lifetimes in a Bulk p-Type SiC Wafer Measured by the Microwave Photoconductivity Decay Method
Excess Carrier Lifetimes in a Bulk p-Type SiC Wafer Measured by the Microwave Photoconductivity Decay Method
Excess Carrier Lifetimes in a Bulk p-Type SiC Wafer Measured by the Microwave Photoconductivity Decay Method
Kawai, M. (author) / Mori, T. (author) / Kato, M. (author) / Ichimura, M. (author) / Sumie, S. (author) / Hashizume, H. (author) / Wright, N. / Johnson, C. M. / Vassilevski, K. / Nikitina, I.
2007-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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