Excess Carrier Lifetimes in a Bulk p-Type SiC Wafer Measured by the Microwave Photoconductivity Decay Method

Kawai, M. / Mori, T. / Kato, M. et al. | British Library Online Contents | 2007

Generation and Recombination Carrier Lifetimes in 4H SiC Epitaxial Wafers

Chung, G.Y. / Loboda, M.J. / Marinella, M.J. et al. | British Library Online Contents | 2009

Variations in the Measured Carrier Lifetimes of n^- 4H-SiC Epilayers

Klein, P.B. / Caldwell, J.D. / Shrivastava, A. et al. | British Library Online Contents | 2009

Highly Uniform Epitaxial SiC-Layers Grown in a Hot Wall CVD Reactor with Mechanical Rotation

Schoner, A. / Konstantinov, A. / Karlsson, S. et al. | British Library Online Contents | 2002

Microsecond Carrier Lifetimes in Bulk-Like 3C-SiC Grown by Sublimation Epitaxy

Sun, J.W. / Kamiyama, S. / Wellmann, P. et al. | British Library Online Contents | 2013