Recombination lifetime characterization and mapping of silicon wafers and detectors using the microwave photoconductivity decay (mPCD) technique

Harkonen, J. / Tuovinen, E. / Li, Z. et al. | British Library Online Contents | 2006

Excess Carrier Lifetimes in a Bulk p-Type SiC Wafer Measured by the Microwave Photoconductivity Decay Method

Kawai, M. / Mori, T. / Kato, M. et al. | British Library Online Contents | 2007

Minority Carrier Lifetime Measurements in Specific Epitaxial 4H-SiC Layers by the Microwave Photoconductivity Decay

Ottaviani, L. / Palais, O. / Barakel, D. et al. | British Library Online Contents | 2009

Carrier Lifetime Analysis by Microwave Photoconductive Decay (mu-PCD) for 4H SiC Epitaxial Wafers

Chung, G. Y. / Loboda, M. J. / MacMillan, M. F. et al. | British Library Online Contents | 2007

Characterization of the Excess Carrier Lifetime of As-Grown and Electron Irradiated Epitaxial p-Type 4H-SiC Layers by the Microwave Photoconductivity Decay Method

Matsushita, Y. / Kato, M. / Ichimura, M. et al. | British Library Online Contents | 2010