Micro-Raman Investigation of Defects in a 4H-SiC Homoepilayer: Fid-Bau Portal

Micro-Raman Investigation of Defects in a 4H-SiC Homoepilayer

Liu, X. F. / Sun, G. S. / Li, J. M. / Zhao, Y. M. / Li, J. Y. / Wang, L. / Zhao, W. S. / Luo, M. C. / Zeng, Y. P.

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Micro-Raman Investigation of Defects in a 4H-SiC Homoepilayer

Liu, X. F. / Sun, G. S. / Li, J. M. / Zhao, Y. M. / Li, J. Y. / Wang, L. / Zhao, W. S. / Luo, M. C. / Zeng, Y. P.

Micro-Raman Investigation of Defects in a 4H-SiC Homoepilayer

Liu, X. F. / Sun, G. S. / Li, J. M. / Zhao, Y. M. / Li, J. Y. / Wang, L. / Zhao, W. S. / Luo, M. C. / Zeng, Y. P.

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Title:

Micro-Raman Investigation of Defects in a 4H-SiC Homoepilayer

Contributors:

Liu, X. F. (author) / Sun, G. S. (author) / Li, J. M. (author) / Zhao, Y. M. (author) / Li, J. Y. (author) / Wang, L. (author) / Zhao, W. S. (author) / Luo, M. C. (author) / Zeng, Y. P. (author) / Wright, N.

Published in:

Silicon Carbide and Related Materials 2006 ; 387-390

MATERIALS SCIENCE FORUM ; 556/557

Publication date:

2007-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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