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Formation of Deep Traps at the 4H-SiC/SiO~2 Interface when Utilizing Sodium Enhanced Oxidation
Formation of Deep Traps at the 4H-SiC/SiO~2 Interface when Utilizing Sodium Enhanced Oxidation
Formation of Deep Traps at the 4H-SiC/SiO~2 Interface when Utilizing Sodium Enhanced Oxidation
Allerstam, F. (author) / Gudjonsson, G. (author) / Sveinbjornsson, E. O. (author) / Rodle, T. (author) / Jos, R. (author) / Wright, N. / Johnson, C. M. / Vassilevski, K. / Nikitina, I. / Horsfall, A.
2007-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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