A platform for research: civil engineering, architecture and urbanism
600 V 100 A 4H-SiC Junction Barrier Schottky Diode with Guard Rings Termination
600 V 100 A 4H-SiC Junction Barrier Schottky Diode with Guard Rings Termination
600 V 100 A 4H-SiC Junction Barrier Schottky Diode with Guard Rings Termination
Yamamoto, T. (author) / Endo, T. (author) / Kato, N. (author) / Nakamura, H. (author) / Sakakibara, T. (author) / Wright, N. / Johnson, C. M. / Vassilevski, K. / Nikitina, I. / Horsfall, A.
2007-01-01
4 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Edge Termination of SiC Schottky Diodes with Guard Rings Formed by High Energy Boron Implantation
British Library Online Contents | 2004
|British Library Online Contents | 2002
|Fabrication of dual-termination Schottky barrier diode by using oxygen-/fluorine-terminated diamond
British Library Online Contents | 2018
|Fabrication of dual-termination Schottky barrier diode by using oxygen-/fluorine-terminated diamond
British Library Online Contents | 2018
|Fabrication of dual-termination Schottky barrier diode by using oxygen-/fluorine-terminated diamond
British Library Online Contents | 2018
|