Investigations of the Indentation-Induced Crystallographic Phase Changes in Silicon Using Raman Spectroscopy: Fid-Bau Portal

Investigations of the Indentation-Induced Crystallographic Phase Changes in Silicon Using Raman Spectroscopy

Chaudhri, M. M. / Khayyat, M. M. O. / Hasko, D. G.

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Investigations of the Indentation-Induced Crystallographic Phase Changes in Silicon Using Raman Spectroscopy

Chaudhri, M. M. / Khayyat, M. M. O. / Hasko, D. G.

Investigations of the Indentation-Induced Crystallographic Phase Changes in Silicon Using Raman Spectroscopy

Chaudhri, M. M. / Khayyat, M. M. O. / Hasko, D. G.

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Check availability in my library

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Document information

Title:

Investigations of the Indentation-Induced Crystallographic Phase Changes in Silicon Using Raman Spectroscopy

Contributors:

Chaudhri, M. M. (author) / Khayyat, M. M. O. (author) / Hasko, D. G. (author)

Published in:

SURFACE REVIEW AND LETTERS ; 14 ; 719-724

Publication date:

2007-01-01

Size:

6 pages

ISSN:

0218-625X

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 530.417

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