A platform for research: civil engineering, architecture and urbanism
Rietveld refinement of the semiconducting system Bi2-xFexTe3 from X-ray powder diffraction
Adam, A. (author)
MATERIALS RESEARCH BULLETIN ; 42 ; 1986-1994
2007-01-01
9 pages
Article (Journal)
English
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 2001
|Rietveld Refinement of the Crystal Structure of Silver-Oxalate from Neutron Powder Diffraction Data
British Library Online Contents | 1996
|Rietveld refinement employing X-ray data on CaWO~4 from different powder diffraction geometries
British Library Online Contents | 1993
|Rietveld refinement employing X-ray data on CaWO~4 from different powder diffraction geometries
British Library Online Contents | 1993
|Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data
British Library Online Contents | 2006
|