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    Quantitative analysis of thin-film conductivity by scanning microwave microscope

    New search for: Okazaki, S.
    New search for: Okazaki, N.
    New search for: Hirose, Y.
    New search for: Furubayashi, Y.
    New search for: Hitosugi, T.
    New search for: Shimada, T.
    New search for: Hasegawa, T.

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    Quantitative analysis of thin-film conductivity by scanning microwave microscope

    New search for: Okazaki, S.
    New search for: Okazaki, N.
    New search for: Hirose, Y.
    New search for: Furubayashi, Y.
    New search for: Hitosugi, T.
    New search for: Shimada, T.
    New search for: Hasegawa, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Quantitative analysis of thin-film conductivity by scanning microwave microscope

    New search for: Okazaki, S.
    New search for: Okazaki, N.
    New search for: Hirose, Y.
    New search for: Furubayashi, Y.
    New search for: Hitosugi, T.
    New search for: Shimada, T.
    New search for: Hasegawa, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Title:

    Quantitative analysis of thin-film conductivity by scanning microwave microscope

    Contributors:

    Okazaki, S. (author) / Okazaki, N. (author) / Hirose, Y. (author) / Furubayashi, Y. (author) / Hitosugi, T. (author) / Shimada, T. (author) / Hasegawa, T. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 254 ; 757-759

    Publication date:

    2007-01-01

    Size:

    3 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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