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High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7-d thin film by the low-temperature scanning microwave microscope
High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7-d thin film by the low-temperature scanning microwave microscope
High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7-d thin film by the low-temperature scanning microwave microscope
Okazaki, S. (author) / Okazaki, N. (author) / Zhao, X. (author) / Sugaya, H. (author) / Yaginuma, S. i. (author) / Takahashi, R. (author) / Murakami, M. (author) / Matsumoto, Y. (author) / Chikyow, T. (author) / Koinuma, H. (author)
APPLIED SURFACE SCIENCE ; 252 ; 2615-2621
2006-01-01
7 pages
Article (Journal)
English
DDC:
621.35
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