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    Transmission electron microscopy study of defect-selective etched (010) ScN crystals

    New search for: Chaudhuri, J.
    New search for: Lee, R. G.
    New search for: Nyakiti, L.
    New search for: Armstrong, J.
    New search for: Gu, Z.
    New search for: Edgar, J. H.
    New search for: Wen, J. G.

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    Transmission electron microscopy study of defect-selective etched (010) ScN crystals

    New search for: Chaudhuri, J.
    New search for: Lee, R. G.
    New search for: Nyakiti, L.
    New search for: Armstrong, J.
    New search for: Gu, Z.
    New search for: Edgar, J. H.
    New search for: Wen, J. G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Transmission electron microscopy study of defect-selective etched (010) ScN crystals

    New search for: Chaudhuri, J.
    New search for: Lee, R. G.
    New search for: Nyakiti, L.
    New search for: Armstrong, J.
    New search for: Gu, Z.
    New search for: Edgar, J. H.
    New search for: Wen, J. G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    Transmission electron microscopy study of defect-selective etched (010) ScN crystals

    Contributors:

    Chaudhuri, J. (author) / Lee, R. G. (author) / Nyakiti, L. (author) / Armstrong, J. (author) / Gu, Z. (author) / Edgar, J. H. (author) / Wen, J. G. (author)

    Published in:

    MATERIALS LETTERS ; 62 ; 27-29

    Publication date:

    2008-01-01

    Size:

    3 pages

    ISSN:

    0167-577X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1105 / 530

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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