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    Photo-Emission Electron Microscopy (PEEM) of Cleaned and Etched 6H-SiC(0001)

    New search for: Hartman, J. D.
    New search for: Naniwae, K.
    New search for: Petrich, C.
    New search for: Ramachandran, V.
    New search for: Feenstra, R. M.
    New search for: Nemanich, R. J.
    New search for: Davis, R. F.

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    Photo-Emission Electron Microscopy (PEEM) of Cleaned and Etched 6H-SiC(0001)

    New search for: Hartman, J. D.
    New search for: Naniwae, K.
    New search for: Petrich, C.
    New search for: Ramachandran, V.
    New search for: Feenstra, R. M.
    New search for: Nemanich, R. J.
    New search for: Davis, R. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Photo-Emission Electron Microscopy (PEEM) of Cleaned and Etched 6H-SiC(0001)

    New search for: Hartman, J. D.
    New search for: Naniwae, K.
    New search for: Petrich, C.
    New search for: Ramachandran, V.
    New search for: Feenstra, R. M.
    New search for: Nemanich, R. J.
    New search for: Davis, R. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Photo-Emission Electron Microscopy (PEEM) of Cleaned and Etched 6H-SiC(0001)

    Contributors:

    Hartman, J. D. (author) / Naniwae, K. (author) / Petrich, C. (author) / Ramachandran, V. (author) / Feenstra, R. M. (author) / Nemanich, R. J. (author) / Davis, R. F. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 338/342 ; 353-356

    Publication date:

    2000-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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