Characterization of Electronic Charged States of Nickel Silicide Nanodots Using AFM/Kelvin Probe Technique: Fid-Bau Portal

Characterization of Electronic Charged States of Nickel Silicide Nanodots Using AFM/Kelvin Probe Technique

Nishihara, R. / Makihara, K. / Kawaguchi, Y. / Ikeda, M. / Murakami, H. / Higashi, S. / Miyazaki, S.

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Characterization of Electronic Charged States of Nickel Silicide Nanodots Using AFM/Kelvin Probe Technique

Nishihara, R. / Makihara, K. / Kawaguchi, Y. / Ikeda, M. / Murakami, H. / Higashi, S. / Miyazaki, S.

Characterization of Electronic Charged States of Nickel Silicide Nanodots Using AFM/Kelvin Probe Technique

Nishihara, R. / Makihara, K. / Kawaguchi, Y. / Ikeda, M. / Murakami, H. / Higashi, S. / Miyazaki, S.

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Title:

Characterization of Electronic Charged States of Nickel Silicide Nanodots Using AFM/Kelvin Probe Technique

Contributors:

Nishihara, R. (author) / Makihara, K. (author) / Kawaguchi, Y. (author) / Ikeda, M. (author) / Murakami, H. (author) / Higashi, S. (author) / Miyazaki, S. (author) / Chang, Y.W. / Kim, N.J. / Lee, C.S.

Published in:

PRICM 6: Selected, peer reviewed papers from The Sixth Pacific Rim International Conference on Advanced Materials and Processing, November 5-9, 2007, ICC Jeju, Jeju Island, Korea ; 1213-1216

MATERIALS SCIENCE FORUM ; 561/565

Publication date:

2007-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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