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Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy

Palermo, V. / Palma, M. / Samori, P.

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Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy

Palermo, V. / Palma, M. / Samori, P.

Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy

Palermo, V. / Palma, M. / Samori, P.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy

Contributors:

Palermo, V. (author) / Palma, M. (author) / Samori, P. (author)

Published in:

ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 18 ; 145-164

Publication date:

2006-01-01

Size:

20 pages

ISSN:

0935-9648

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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