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    Estimation of lattice strain in nanocrystalline silver from X-ray diffraction line broadening

    New search for: Biju, V.
    New search for: Sugathan, N.
    New search for: Vrinda, V.
    New search for: Salini, S. L.

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    Estimation of lattice strain in nanocrystalline silver from X-ray diffraction line broadening

    New search for: Biju, V.
    New search for: Sugathan, N.
    New search for: Vrinda, V.
    New search for: Salini, S. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Estimation of lattice strain in nanocrystalline silver from X-ray diffraction line broadening

    New search for: Biju, V.
    New search for: Sugathan, N.
    New search for: Vrinda, V.
    New search for: Salini, S. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Estimation of lattice strain in nanocrystalline silver from X-ray diffraction line broadening

    Contributors:

    Biju, V. (author) / Sugathan, N. (author) / Vrinda, V. (author) / Salini, S. L. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 43 ; 1175-1179

    Publication date:

    2008-01-01

    Size:

    5 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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