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    Microstructural study of annealed gold-silicon thin films under nanoindentation

    New search for: Lee, W. S.
    New search for: Fong, F. J.

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    Microstructural study of annealed gold-silicon thin films under nanoindentation

    New search for: Lee, W. S.
    New search for: Fong, F. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Microstructural study of annealed gold-silicon thin films under nanoindentation

    New search for: Lee, W. S.
    New search for: Fong, F. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Microstructural study of annealed gold-silicon thin films under nanoindentation

    Contributors:

    Lee, W. S. (author) / Fong, F. J. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING A ; 475 ; 319-326

    Publication date:

    2008-01-01

    Size:

    8 pages

    ISSN:

    0921-5093

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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