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Nanoindentation Behaviour and Annealed Microstructural Evolution of Ni/Si Thin Film

Lee, W.-S. / Chen, T.-H. / Lin, C.-F. / Chen, J.-M.

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Nanoindentation Behaviour and Annealed Microstructural Evolution of Ni/Si Thin Film

Lee, W.-S. / Chen, T.-H. / Lin, C.-F. / Chen, J.-M.

Nanoindentation Behaviour and Annealed Microstructural Evolution of Ni/Si Thin Film

Lee, W.-S. / Chen, T.-H. / Lin, C.-F. / Chen, J.-M.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Nanoindentation Behaviour and Annealed Microstructural Evolution of Ni/Si Thin Film

Contributors:

Lee, W.-S. (author) / Chen, T.-H. (author) / Lin, C.-F. (author) / Chen, J.-M. (author)

Published in:

MATERIALS TRANSACTIONS ; 52 ; 1374-1380

Publication date:

2011-01-01

Size:

7 pages

ISSN:

1345-9678

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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