Nanoindentation Behaviour and Microstructural Evolution of Au/Cr/Si Thin Films: Fid-Bau Portal

Nanoindentation Behaviour and Microstructural Evolution of Au/Cr/Si Thin Films

Lee, W.-S. / Liu, T.-Y. / Chen, T.-H.

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Nanoindentation Behaviour and Microstructural Evolution of Au/Cr/Si Thin Films

Lee, W.-S. / Liu, T.-Y. / Chen, T.-H.

Nanoindentation Behaviour and Microstructural Evolution of Au/Cr/Si Thin Films

Lee, W.-S. / Liu, T.-Y. / Chen, T.-H.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Nanoindentation Behaviour and Microstructural Evolution of Au/Cr/Si Thin Films

Contributors:

Lee, W.-S. (author) / Liu, T.-Y. (author) / Chen, T.-H. (author)

Published in:

MATERIALS TRANSACTIONS ; 50 ; 1768-1777

Publication date:

2009-01-01

Size:

10 pages

ISSN:

1345-9678

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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