Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties: Fid-Bau Portal

Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties

Gajovic, A. / Gracin, D. / Djerdj, I. / Tomasic, N. / Juraic, K. / Su, D. S.

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Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties

Gajovic, A. / Gracin, D. / Djerdj, I. / Tomasic, N. / Juraic, K. / Su, D. S.

Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties

Gajovic, A. / Gracin, D. / Djerdj, I. / Tomasic, N. / Juraic, K. / Su, D. S.

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Check availability in my library

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Document information

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Document information

Title:

Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties

Contributors:

Gajovic, A. (author) / Gracin, D. (author) / Djerdj, I. (author) / Tomasic, N. (author) / Juraic, K. (author) / Su, D. S. (author)

Published in:

APPLIED SURFACE SCIENCE ; 254 ; 2748-2754

Publication date:

2008-01-01

Size:

7 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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