Electrical characterization of low defect density nonpolar (1120) a-plane GaN grown with sidewall lateral epitaxial overgrowth (SLEO): Fid-Bau Portal

Electrical characterization of low defect density nonpolar (1120) a-plane GaN grown with sidewall lateral epitaxial overgrowth (SLEO)

Imer, B. / Haskell, B. / Rajan, S. / Keller, S. / Mishra, U.K. / Nakamura, S. / Speck, J.S. / DenBaars, S.P.

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Electrical characterization of low defect density nonpolar (1120) a-plane GaN grown with sidewall lateral epitaxial overgrowth (SLEO)

Imer, B. / Haskell, B. / Rajan, S. / Keller, S. / Mishra, U.K. / Nakamura, S. / Speck, J.S. / DenBaars, S.P.

Electrical characterization of low defect density nonpolar (1120) a-plane GaN grown with sidewall lateral epitaxial overgrowth (SLEO)

Imer, B. / Haskell, B. / Rajan, S. / Keller, S. / Mishra, U.K. / Nakamura, S. / Speck, J.S. / DenBaars, S.P.

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Check availability in my library

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Document information

Title:

Electrical characterization of low defect density nonpolar (1120) a-plane GaN grown with sidewall lateral epitaxial overgrowth (SLEO)

Contributors:

Imer, B. (author) / Haskell, B. (author) / Rajan, S. (author) / Keller, S. (author) / Mishra, U.K. (author) / Nakamura, S. (author) / Speck, J.S. (author) / DenBaars, S.P. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 23 ; 551-555

Publication date:

2008-01-01

Size:

5 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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