Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers: Fid-Bau Portal

Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers

Wagner, M. / Mustafa, E. / Hahn, S. / Syvajarvi, M. / Yakimova, R. / Jang, S. / Sakwe, S. A. / Wellmann, P. J.

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Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers

Wagner, M. / Mustafa, E. / Hahn, S. / Syvajarvi, M. / Yakimova, R. / Jang, S. / Sakwe, S. A. / Wellmann, P. J.

Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers

Wagner, M. / Mustafa, E. / Hahn, S. / Syvajarvi, M. / Yakimova, R. / Jang, S. / Sakwe, S. A. / Wellmann, P. J.

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Document information

Title:

Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers

Contributors:

Wagner, M. (author) / Mustafa, E. (author) / Hahn, S. (author) / Syvajarvi, M. (author) / Yakimova, R. (author) / Jang, S. (author) / Sakwe, S. A. (author) / Wellmann, P. J. (author) / Wright, N. / Johnson, C. M.

Published in:

Silicon Carbide and Related Materials 2006 ; 327-330

MATERIALS SCIENCE FORUM ; 556/557

Publication date:

2007-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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