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    Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals

    New search for: Basa, P.
    New search for: Alagoz, A. S.
    New search for: Lohner, T.
    New search for: Kulakci, M.
    New search for: Turan, R.
    New search for: Nagy, K.
    New search for: Horvath, Z. J.

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    Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals

    New search for: Basa, P.
    New search for: Alagoz, A. S.
    New search for: Lohner, T.
    New search for: Kulakci, M.
    New search for: Turan, R.
    New search for: Nagy, K.
    New search for: Horvath, Z. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals

    New search for: Basa, P.
    New search for: Alagoz, A. S.
    New search for: Lohner, T.
    New search for: Kulakci, M.
    New search for: Turan, R.
    New search for: Nagy, K.
    New search for: Horvath, Z. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals

    Contributors:

    Basa, P. (author) / Alagoz, A. S. (author) / Lohner, T. (author) / Kulakci, M. (author) / Turan, R. (author) / Nagy, K. (author) / Horvath, Z. J. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 254 ; 3626-3629

    Publication date:

    2008-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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