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    Spectroscopic ellipsometry study of Si nanocrystals embedded in a SiOx matrix: Modeling and optical characterization

    New search for: Ilday, S.
    New search for: Nogay, G.
    New search for: Turan, R.

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    Spectroscopic ellipsometry study of Si nanocrystals embedded in a SiOx matrix: Modeling and optical characterization

    New search for: Ilday, S.
    New search for: Nogay, G.
    New search for: Turan, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spectroscopic ellipsometry study of Si nanocrystals embedded in a SiOx matrix: Modeling and optical characterization

    New search for: Ilday, S.
    New search for: Nogay, G.
    New search for: Turan, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Spectroscopic ellipsometry study of Si nanocrystals embedded in a SiOx matrix: Modeling and optical characterization

    Contributors:

    Ilday, S. (author) / Nogay, G. (author) / Turan, R. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 318 ; 256-261

    Publication date:

    2014-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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