Passivation cracking analysis of integrated-circuit microstructures under aeronautical conditions: Fid-Bau Portal

Passivation cracking analysis of integrated-circuit microstructures under aeronautical conditions

He, Y. / Li, H. / Zhang, H. / Li, F. / Fan, C.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Passivation cracking analysis of integrated-circuit microstructures under aeronautical conditions

He, Y. / Li, H. / Zhang, H. / Li, F. / Fan, C.

Passivation cracking analysis of integrated-circuit microstructures under aeronautical conditions

He, Y. / Li, H. / Zhang, H. / Li, F. / Fan, C.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Passivation cracking analysis of integrated-circuit microstructures under aeronautical conditions

Contributors:

He, Y. (author) / Li, H. (author) / Zhang, H. (author) / Li, F. (author) / Fan, C. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING A ; 483/484 ; 340-342

Publication date:

2008-01-01

Size:

3 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

He, Y.T. / Li, H.P. / Cui, R.H. et al. | British Library Online Contents | 2008

Geometry Sensitivity Analyses of Microstructures of IC Packages on Passivation Cracking

He, Y. T. / Li, F. / Shi, R. et al. | British Library Online Contents | 2005

Passivation of vanadium and nickel on cracking catalysts

Lysenko, S.V. / Korol'kov, N.S. / Karakhanov, E.A. | Elsevier | 1987

Passivation Cracking Analyses of Micro-Structures of IC Packages

He, Y. T. / Li, H. P. / Shi, R. et al. | British Library Online Contents | 2006

Fragiel, A. / Serna, S. / Campillo, B. et al. | British Library Online Contents | 2007