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Passivation Cracking Analyses of Micro-Structures of IC Packages

He, Y. T. / Li, H. P. / Shi, R. / Li, F. / Zhang, G. Q. / Ernst, L. J.

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Passivation Cracking Analyses of Micro-Structures of IC Packages

He, Y. T. / Li, H. P. / Shi, R. / Li, F. / Zhang, G. Q. / Ernst, L. J.

Passivation Cracking Analyses of Micro-Structures of IC Packages

He, Y. T. / Li, H. P. / Shi, R. / Li, F. / Zhang, G. Q. / Ernst, L. J.

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Check availability in my library

Order at Subito €

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Document information

Title:

Passivation Cracking Analyses of Micro-Structures of IC Packages

Contributors:

He, Y. T. (author) / Li, H. P. (author) / Shi, R. (author) / Li, F. (author) / Zhang, G. Q. (author) / Ernst, L. J. (author) / Aliabadi, M. H. / Li, Q. / Li, L. / Buchholz, F.-G.

Published in:

Fracture and Damage Mechanics V Part 1 ; 515-518

KEY ENGINEERING MATERIALS ; 324/325

Publication date:

2006-01-01

Size:

4 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

He, Y. T. / Li, F. / Shi, R. et al. | British Library Online Contents | 2005

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Lysenko, S.V. / Korol'kov, N.S. / Karakhanov, E.A. | Elsevier | 1987

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He, Y. / Li, H. / Zhang, H. et al. | British Library Online Contents | 2008

3D restraint analyses of typical structures with early age cracking problems

Kanstad, Terje / Bosnjak, Daniela / Øverli, Jan Arve | TIBKAT | 2001