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Effects of thermal annealing on the microstructural properties of the lower region in ZnO thin films grown on n-Si (001) substrates

Yuk, J.M. / Lee, J.Y. / Kim, T.W. / Son, D.I. / Choi, W.K.

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Effects of thermal annealing on the microstructural properties of the lower region in ZnO thin films grown on n-Si (001) substrates

Yuk, J.M. / Lee, J.Y. / Kim, T.W. / Son, D.I. / Choi, W.K.

Effects of thermal annealing on the microstructural properties of the lower region in ZnO thin films grown on n-Si (001) substrates

Yuk, J.M. / Lee, J.Y. / Kim, T.W. / Son, D.I. / Choi, W.K.

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Check availability in my library

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Document information

Title:

Effects of thermal annealing on the microstructural properties of the lower region in ZnO thin films grown on n-Si (001) substrates

Contributors:

Yuk, J.M. (author) / Lee, J.Y. (author) / Kim, T.W. (author) / Son, D.I. (author) / Choi, W.K. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 23 ; 1082-1086

Publication date:

2008-01-01

Size:

5 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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