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Structural investigations of TiO2:Tb thin films by X-ray diffraction and atomic force microscopy
Structural investigations of TiO2:Tb thin films by X-ray diffraction and atomic force microscopy
Structural investigations of TiO2:Tb thin films by X-ray diffraction and atomic force microscopy
Kaczmarek, D. (author) / Domaradzki, J. (author) / Wojcieszak, D. (author) / Wasielewski, R. (author) / Borkowska, A. (author) / Prociow, E. L. (author) / Ciszewski, A. (author)
APPLIED SURFACE SCIENCE ; 254 ; 4303-4307
2008-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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