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    Characterization of deep levels in high electron mobility transistor by conductance deep level transient spectroscopy

    New search for: Gassoumi, M.
    New search for: Bluet, J. M.
    New search for: Guillot, G.
    New search for: Gaquière, C.
    New search for: Maaref, H.

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    Characterization of deep levels in high electron mobility transistor by conductance deep level transient spectroscopy

    New search for: Gassoumi, M.
    New search for: Bluet, J. M.
    New search for: Guillot, G.
    New search for: Gaquière, C.
    New search for: Maaref, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of deep levels in high electron mobility transistor by conductance deep level transient spectroscopy

    New search for: Gassoumi, M.
    New search for: Bluet, J. M.
    New search for: Guillot, G.
    New search for: Gaquière, C.
    New search for: Maaref, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterization of deep levels in high electron mobility transistor by conductance deep level transient spectroscopy

    Contributors:

    Gassoumi, M. (author) / Bluet, J. M. (author) / Guillot, G. (author) / Gaquière, C. (author) / Maaref, H. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING -AMSTERDAM THEN LAUSANNE- C ; 28 ; 787-790

    Publication date:

    2008-01-01

    Size:

    4 pages

    ISSN:

    0928-4931

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1 / 660

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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