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    Characterization of Deep Levels in High-Resistive 6H-SiC by Current Deep Level Transient Spectroscopy

    New search for: Kato, M.
    New search for: Kito, K.
    New search for: Ichimura, M.

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    Characterization of Deep Levels in High-Resistive 6H-SiC by Current Deep Level Transient Spectroscopy

    New search for: Kato, M.
    New search for: Kito, K.
    New search for: Ichimura, M.

    Access

    Access via TIB
    Check availability in my library
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    Characterization of Deep Levels in High-Resistive 6H-SiC by Current Deep Level Transient Spectroscopy

    New search for: Kato, M.
    New search for: Kito, K.
    New search for: Ichimura, M.

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Characterization of Deep Levels in High-Resistive 6H-SiC by Current Deep Level Transient Spectroscopy

    Contributors:

    Kato, M. (author) / Kito, K. (author) / Ichimura, M. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 615/617 ; 381-384

    Publication date:

    2009-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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