Raman spectroscopic studies of PbxLa1-xTi1-x/4O3 thin films grown on Si substrates by RF magnetron sputtering: Fid-Bau Portal

Raman spectroscopic studies of PbxLa1-xTi1-x/4O3 thin films grown on Si substrates by RF magnetron sputtering

Zhu, J. L. / Zhu, W. L. / Li, R. T. / Ge, W. Y. / Jiang, M. / Zhu, J. G. / Xiao, D. Q. / Pezzotti, G.

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Raman spectroscopic studies of PbxLa1-xTi1-x/4O3 thin films grown on Si substrates by RF magnetron sputtering

Zhu, J. L. / Zhu, W. L. / Li, R. T. / Ge, W. Y. / Jiang, M. / Zhu, J. G. / Xiao, D. Q. / Pezzotti, G.

Raman spectroscopic studies of PbxLa1-xTi1-x/4O3 thin films grown on Si substrates by RF magnetron sputtering

Zhu, J. L. / Zhu, W. L. / Li, R. T. / Ge, W. Y. / Jiang, M. / Zhu, J. G. / Xiao, D. Q. / Pezzotti, G.

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Title:

Raman spectroscopic studies of PbxLa1-xTi1-x/4O3 thin films grown on Si substrates by RF magnetron sputtering

Contributors:

Zhu, J. L. (author) / Zhu, W. L. (author) / Li, R. T. (author) / Ge, W. Y. (author) / Jiang, M. (author) / Zhu, J. G. (author) / Xiao, D. Q. (author) / Pezzotti, G. (author)

Published in:

APPLIED SURFACE SCIENCE ; 254 ; 4803-4807

Publication date:

2008-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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