The use of electron back-scattered diffraction to study the regrowth of amorphised silicon-based heterostructures: Fid-Bau Portal

The use of electron back-scattered diffraction to study the regrowth of amorphised silicon-based heterostructures

Vernon-Parry, K. D. / Abd-El-Rahman, K. F. / Brough, I. / Evans-Freeman, J. H. / Zhang, J. / Peaker, A. R.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

The use of electron back-scattered diffraction to study the regrowth of amorphised silicon-based heterostructures

Vernon-Parry, K. D. / Abd-El-Rahman, K. F. / Brough, I. / Evans-Freeman, J. H. / Zhang, J. / Peaker, A. R.

The use of electron back-scattered diffraction to study the regrowth of amorphised silicon-based heterostructures

Vernon-Parry, K. D. / Abd-El-Rahman, K. F. / Brough, I. / Evans-Freeman, J. H. / Zhang, J. / Peaker, A. R.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

The use of electron back-scattered diffraction to study the regrowth of amorphised silicon-based heterostructures

Contributors:

Vernon-Parry, K. D. (author) / Abd-El-Rahman, K. F. (author) / Brough, I. (author) / Evans-Freeman, J. H. (author) / Zhang, J. (author) / Peaker, A. R. (author)

Published in:

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 4 ; 121-123

Publication date:

2001-01-01

Size:

3 pages

ISSN:

1369-8001

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.38152

Cristiano, F. / Bazizi, E.M. / Fazzini, P.F. et al. | British Library Online Contents | 2008

Solid-phase epitaxial regrowth of a shallow amorphised Si layer studied by X-ray and medium energy ion scattering

Capello, L. / Metzger, T. H. / Werner, M. et al. | British Library Online Contents | 2005

Study of texture in a TiTaNb alloy using electron back scattered diffraction technique

Karthikeyan, T. / Dasgupta, A. / Khan, A. J. et al. | British Library Online Contents | 2005

Modelling and Regrowth Mechanisms of Flashlamp Processing of SiC-on-Silicon Heterostructures

Smith, M. / McMahon, R. / Voelskow, M. et al. | British Library Online Contents | 2004

Magnetic susceptibility of P+N junctions in correlation with the nature of silicon substrate: crystalline or pre-amorphised

Abdelaoui, M. / Idrissi-Benzohra, M. / Joubert, E. et al. | British Library Online Contents | 2003