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Analysis of electrical equivalent circuit of metal-insulator-semiconductor structure based on admittance measurements
Analysis of electrical equivalent circuit of metal-insulator-semiconductor structure based on admittance measurements
Analysis of electrical equivalent circuit of metal-insulator-semiconductor structure based on admittance measurements
Kochowski, S. (author) / Szydlowski, M. (author) / Paszkiewicz, R. (author) / Paszkiewicz, B. (author)
MATERIALS SCIENCE -WROCLAW- ; 26 ; 63-70
2008-01-01
8 pages
Article (Journal)
English
DDC:
620.11
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