Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Controlling electromigration to selectively form thin metal wires and metal microspheres

    New search for: Saka, M.
    New search for: Kato, K.
    New search for: Tohmyoh, H.
    New search for: Sun, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Controlling electromigration to selectively form thin metal wires and metal microspheres

    New search for: Saka, M.
    New search for: Kato, K.
    New search for: Tohmyoh, H.
    New search for: Sun, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Controlling electromigration to selectively form thin metal wires and metal microspheres

    New search for: Saka, M.
    New search for: Kato, K.
    New search for: Tohmyoh, H.
    New search for: Sun, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Controlling electromigration to selectively form thin metal wires and metal microspheres

    Contributors:

    Saka, M. (author) / Kato, K. (author) / Tohmyoh, H. (author) / Sun, Y. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 23 ; 3122-3128

    Publication date:

    2008-01-01

    Size:

    7 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Electromigration Failure of Metal Lines

    Abé, H. / Sasagawa, K. / Saka, M. | British Library Online Contents | 2006

    A simple technique to prevent electromigration damage in printed Ag thin wires

    Xu, Xiaobin / Lu, Yebo / Tang, Chengli et al. | British Library Online Contents | 2018

    A simple technique to prevent electromigration damage in printed Ag thin wires

    Xu, Xiaobin / Lu, Yebo / Tang, Chengli et al. | British Library Online Contents | 2018

    Theory of surface electromigration on heterogeneous metal surfaces

    Rous, P. J. | British Library Online Contents | 2001

    Time dependence of stress and hillock distributions during electromigration in thin metal film interconnections

    Klinger, L. / Glickman, E. / Katsman, A. et al. | British Library Online Contents | 1994

    Back to top