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    A simple technique to prevent electromigration damage in printed Ag thin wires

    New search for: Xu, Xiaobin
    New search for: Lu, Yebo
    New search for: Tang, Chengli
    New search for: Sun, Quan
    New search for: Huang, Fengli

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    A simple technique to prevent electromigration damage in printed Ag thin wires

    New search for: Xu, Xiaobin
    New search for: Lu, Yebo
    New search for: Tang, Chengli
    New search for: Sun, Quan
    New search for: Huang, Fengli

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A simple technique to prevent electromigration damage in printed Ag thin wires

    New search for: Xu, Xiaobin
    New search for: Lu, Yebo
    New search for: Tang, Chengli
    New search for: Sun, Quan
    New search for: Huang, Fengli

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    A simple technique to prevent electromigration damage in printed Ag thin wires

    Contributors:

    Xu, Xiaobin (author) / Lu, Yebo (author) / Tang, Chengli (author) / Sun, Quan (author) / Huang, Fengli (author)

    Published in:

    MATERIALS LETTERS ; 225 ; 21-23

    Publication date:

    2018-01-01

    Size:

    3 pages

    ISSN:

    0167-577X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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