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Depth profiling of organic materials using improved ion beam conditions

Cramer, H. G. / Grehl, T. / Kollmer, F. / Moellers, R. / Niehuis, E. / Rading, D.

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Depth profiling of organic materials using improved ion beam conditions

Cramer, H. G. / Grehl, T. / Kollmer, F. / Moellers, R. / Niehuis, E. / Rading, D.

Depth profiling of organic materials using improved ion beam conditions

Cramer, H. G. / Grehl, T. / Kollmer, F. / Moellers, R. / Niehuis, E. / Rading, D.

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Order at Subito €

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Document information

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Document information

Title:

Depth profiling of organic materials using improved ion beam conditions

Contributors:

Cramer, H. G. (author) / Grehl, T. (author) / Kollmer, F. (author) / Moellers, R. (author) / Niehuis, E. (author) / Rading, D. (author)

Published in:

APPLIED SURFACE SCIENCE ; 255 ; 966-969

Publication date:

2008-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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