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Molecular depth profiling of trehalose using a C60 cluster ion beam
Molecular depth profiling of trehalose using a C60 cluster ion beam
Molecular depth profiling of trehalose using a C60 cluster ion beam
Wucher, A. (author) / Cheng, J. (author) / Winograd, N. (author)
APPLIED SURFACE SCIENCE ; 255 ; 959-961
2008-01-01
3 pages
Article (Journal)
English
DDC:
621.35
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