Improvement of sensitivity using principal component analysis by dual focused ion beam time-of-flight secondary ion mass spectrometry: Fid-Bau Portal

Improvement of sensitivity using principal component analysis by dual focused ion beam time-of-flight secondary ion mass spectrometry

Morita, Y. / Owari, M.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Improvement of sensitivity using principal component analysis by dual focused ion beam time-of-flight secondary ion mass spectrometry

Morita, Y. / Owari, M.

Improvement of sensitivity using principal component analysis by dual focused ion beam time-of-flight secondary ion mass spectrometry

Morita, Y. / Owari, M.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Improvement of sensitivity using principal component analysis by dual focused ion beam time-of-flight secondary ion mass spectrometry

Contributors:

Morita, Y. (author) / Owari, M. (author)

Published in:

APPLIED SURFACE SCIENCE ; 255 ; 1052-1054

Publication date:

2008-01-01

Size:

3 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Kim, Y. P. / Hong, M. Y. / Shon, H. K. et al. | British Library Online Contents | 2008

Chemical and microstructural characterizations of plasma polymer films by time-of-flight secondary ion mass spectrometry and principal component analysis

Cossement, D. / Renaux, F. / Thiry, D. et al. | British Library Online Contents | 2015

Chemical and microstructural characterizations of plasma polymer films by time-of-flight secondary ion mass spectrometry and principal component analysis

Cossement, Damien / Renaux, Fabian / Thiry, Damien et al. | British Library Online Contents | 2015

Chemical and microstructural characterizations of plasma polymer films by time-of-flight secondary ion mass spectrometry and principal component analysis

Cossement, Damien / Renaux, Fabian / Thiry, Damien et al. | British Library Online Contents | 2015

Imaging of aerosols using time of flight secondary ion mass spectrometry

Font Palma, C. / Evans, G. J. / Sodhi, R. N. | British Library Online Contents | 2007