Chemical and microstructural characterizations of plasma polymer films by time-of-flight secondary ion mass spectrometry and principal component analysis

Cossement, D. / Renaux, F. / Thiry, D. et al. | British Library Online Contents | 2015

Chemical and microstructural characterizations of plasma polymer films by time-of-flight secondary ion mass spectrometry and principal component analysis

Cossement, Damien / Renaux, Fabian / Thiry, Damien et al. | British Library Online Contents | 2015

Improvement of sensitivity using principal component analysis by dual focused ion beam time-of-flight secondary ion mass spectrometry

Morita, Y. / Owari, M. | British Library Online Contents | 2008

Protein quantification on dendrimer-activated surfaces by using time-of-flight secondary ion mass spectrometry and principal component regression

Kim, Y. P. / Hong, M. Y. / Shon, H. K. et al. | British Library Online Contents | 2008

Imaging by time-of-flight secondary ion mass spectrometry of plasma patterned metal and oxide thin films

Coullerez, G. / Baborowski, J. / Viornery, C. et al. | British Library Online Contents | 2003