Protein quantification on dendrimer-activated surfaces by using time-of-flight secondary ion mass spectrometry and principal component regression: Fid-Bau Portal

Protein quantification on dendrimer-activated surfaces by using time-of-flight secondary ion mass spectrometry and principal component regression

Kim, Y. P. / Hong, M. Y. / Shon, H. K. / Chegal, W. / Cho, H. M. / Moon, D. W. / Kim, H. S. / Lee, T. G.

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Protein quantification on dendrimer-activated surfaces by using time-of-flight secondary ion mass spectrometry and principal component regression

Kim, Y. P. / Hong, M. Y. / Shon, H. K. / Chegal, W. / Cho, H. M. / Moon, D. W. / Kim, H. S. / Lee, T. G.

Protein quantification on dendrimer-activated surfaces by using time-of-flight secondary ion mass spectrometry and principal component regression

Kim, Y. P. / Hong, M. Y. / Shon, H. K. / Chegal, W. / Cho, H. M. / Moon, D. W. / Kim, H. S. / Lee, T. G.

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Check availability in my library

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Document information

Title:

Protein quantification on dendrimer-activated surfaces by using time-of-flight secondary ion mass spectrometry and principal component regression

Contributors:

Kim, Y. P. (author) / Hong, M. Y. (author) / Shon, H. K. (author) / Chegal, W. (author) / Cho, H. M. (author) / Moon, D. W. (author) / Kim, H. S. (author) / Lee, T. G. (author)

Published in:

APPLIED SURFACE SCIENCE ; 255 ; 1110-1112

Publication date:

2008-01-01

Size:

3 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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