Imaging subcellular features of a sectioned rat brain using time-of-flight secondary ion mass spectrometry and scanning probe microscopy: Fid-Bau Portal

Imaging subcellular features of a sectioned rat brain using time-of-flight secondary ion mass spectrometry and scanning probe microscopy

Nie, H. Y. / Francis, J. T. / Taylor, A. R. / Walzak, M. J. / Chang, W. H. / MacFabe, D. F. / Lau, W. M.

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Imaging subcellular features of a sectioned rat brain using time-of-flight secondary ion mass spectrometry and scanning probe microscopy

Nie, H. Y. / Francis, J. T. / Taylor, A. R. / Walzak, M. J. / Chang, W. H. / MacFabe, D. F. / Lau, W. M.

Imaging subcellular features of a sectioned rat brain using time-of-flight secondary ion mass spectrometry and scanning probe microscopy

Nie, H. Y. / Francis, J. T. / Taylor, A. R. / Walzak, M. J. / Chang, W. H. / MacFabe, D. F. / Lau, W. M.

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Document information

Title:

Imaging subcellular features of a sectioned rat brain using time-of-flight secondary ion mass spectrometry and scanning probe microscopy

Contributors:

Nie, H. Y. (author) / Francis, J. T. (author) / Taylor, A. R. (author) / Walzak, M. J. (author) / Chang, W. H. (author) / MacFabe, D. F. (author) / Lau, W. M. (author)

Published in:

APPLIED SURFACE SCIENCE ; 255 ; 1079-1083

Publication date:

2008-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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