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    High-resolution X-ray diffraction by end of range defects in self-amorphized Ge

    New search for: Bisognin, G.
    New search for: Vangelista, S.
    New search for: Bruno, E.

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    High-resolution X-ray diffraction by end of range defects in self-amorphized Ge

    New search for: Bisognin, G.
    New search for: Vangelista, S.
    New search for: Bruno, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High-resolution X-ray diffraction by end of range defects in self-amorphized Ge

    New search for: Bisognin, G.
    New search for: Vangelista, S.
    New search for: Bruno, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    High-resolution X-ray diffraction by end of range defects in self-amorphized Ge

    Contributors:

    Bisognin, G. (author) / Vangelista, S. (author) / Bruno, E. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B ADVANCED FUNCTIONAL SOLID STATE MATERIALS ; 154-155 ; 64-67

    Publication date:

    2008-01-01

    Size:

    4 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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